Formation and properties of molybdenum oxide injecting contacts for organic electronics devices

Мұқаба

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

Using the X-ray and ultraviolet photoelectron spectroscopy, X-ray diffraction and atomic force microscopy the atomic composition, work function, and structural properties of thin (10–150 nm) MoO3 films obtained by magnetron sputtering were carried out.

Авторлар туралы

A. Komolov

St. Petersburg State University

Email: a.komolov@spbu.ru
St. Petersburg, 199034 Russia

E. Dubov

St. Petersburg State University

St. Petersburg, 199034 Russia

M. Ubovich

St. Petersburg State University

St. Petersburg, 199034 Russia

A. Komolova

St. Petersburg State University

St. Petersburg, 199034 Russia

E. Lazneva

St. Petersburg State University

St. Petersburg, 199034 Russia

V. Sobolev

St. Petersburg State University

St. Petersburg, 199034 Russia

I. Pronin

Penza State University

Penza, 440026 Russia

S. Pshenichnyuk

Institute of Molecule and Crystal Physics, Ufa Federal Research Centre of the Russian Academy of Sciences

Ufa, 450054 Russia

F. Akbarova

Institute of Material Science, Uzbekistan Academy of Sciences

Tashkent, 100084 Uzbekistan

U. Sharopov

Physical-Technical Institute, Uzbekistan Academy of Sciences; Bukhara State University

Tashkent, 100084 Uzbekistan; Bukhara, 200118 Uzbekistan

Әдебиет тізімі

  1. Dominskii D.I., Kharlanov O.G., Trukhanov V.A. et al. // ACS Appl. Electron. Mater. 2022. V. 4. P. 6345.
  2. Nenashev G.V., Kryukov R.S., Istomina M.S. et al. // J. Mater. Sci. Mater. Electron. 2023. V. 34. P. 2114.
  3. White R.T., Thibau E.S., Lu Z.H. // Sci. Reports. 2016. V. 6. No. 1. Art. No. 21109.
  4. Bin Z., Guo H., Liu Z., Li F. et al. // ACS Appl. Mater. Interfaces 2018. V. 10. No. 5. P. 4882.
  5. Томаев В.В., Полищук В.А., Леонов Н.Б. и др. // Изв. РАН. Сер. физ. 2023. Т. 87. №. 10. С. 1446; Tomaev V.V., Polischuk V.A., Leonov N.B. et al. // Bull. Russ. Acad. Sci. Phys. 2023. V. 87. No. 10. P. 1478.
  6. Pshenichnyuk S.A., Modelli A., Lazneva E.F. et al. // J. Phys. Chem. A. 2014. V. 118. P. 6810.
  7. Pshenichnyuk S.A., Modelli A., Lazneva E.F. et al. // J. Phys. Chem. A. 2016. V. 120. P. 2667.
  8. Komolov A.S., Lazneva E.F., Gerasimova N.B. et al. // J. Electron Spectr. Rel. Phenom. 2019. V. 235. P. 40.
  9. Komolov A.S., Lazneva E.F., Akhremtchik S.N. // App. Surf. Sci. 2010. V. 256. P. 2419.
  10. Hill I.G., Kahn A., Cornil J. et al. // Chem. Phys. Lett. 2000. V. 317. P. 444.
  11. Ramana C.V., Atuchin V.V., Kesler V.G. et al. // Appl. Surf. Sci. 2007. V. 253. P. 5368.
  12. Komolov A.S., Schaumburg K., Moeller P.J. et al. // Appl. Surf. Sci. 1999. V. 142. P. 591.
  13. Sharopov U., Samiev K., To’raev A. et al. // Vacuum. 2024. V. 227. Art. No. 113395
  14. Комолов А.С., Лазнева Э.Ф., Герасимова Н.Б. и др. // Кристаллография. 2024. Т. 69. № 4. С. 670; Komolov A.S., Lazneva E.F., Gerasimova N.B. et al. // Crystallography Reports. 2024. V. 69. No. 4. P. 556.
  15. Cauduro A.L.F., dos Reis R., Chen G. et al. // Ultramicroscopy 2017. V. 183. P. 99.
  16. Sharma N., Kumar R., Jayabalan J. // Curr. Appl. Phys. 2021. V. 21. P. 58.
  17. Комолов С.А., Лазнева Э.Ф., Комолов А.С. // Письма в ЖТФ. 2003. T. 29. № 12. С. 13; Komolov S.A., Lazneva E.F., Komolov A.S. // Techn. Phys. Lett. 2003. V. 29. No. 12. P. 974.
  18. Tokarz-Sobieraj R., Hermann K., Witko M. et al. // Surf. Sci. 2001. V. 489. No. 1–3. P. 107.

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML
Жүктеу

© Russian Academy of Sciences, 2025